Electron transport properties in m-plane and c-plane AlN/GaN heterostructures with interface roughness and anisotropic in-plane strain scatterings

Publisher: IOP Publishing

E-ISSN: 1361-6463|48|8|85301-85305

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.48, Iss.8, 2015-03, pp. : 85301-85305

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Abstract