High-Temperature Performance Analysis of AlGaN/GaN Polarization Doped Field Effect Transistors Based on the Quasi-Multi-Channel Model

Publisher: IOP Publishing

E-ISSN: 1741-3540|32|3|37202-37205

ISSN: 0256-307X

Source: Chinese Physics Letters, Vol.32, Iss.3, 2015-03, pp. : 37202-37205

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