Publisher: IOP Publishing
E-ISSN: 1361-6641|30|2|24001-24016
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.30, Iss.2, 2015-02, pp. : 24001-24016
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Wide band gap semiconductor reliability : Status and trends
Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. :