Influence of Annealing on the Stress‐Assisted Two‐Way Memory Effect in Cold‐Worked NiTi Wire

E-ISSN： 1527-2648|17|2|162-166

ISSN： 1438-1656

Source： ADVANCED ENGINEERING MATERIALS (ELECTRONIC), Vol.17, Iss.2, 2015-02, pp. : 162-166

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