Publisher： John Wiley & Sons Inc
E-ISSN： 1521-4001|95|3|283-296
ISSN： 0044-2267
Source： ZAMM-ZEITSCHRIFT FUER ANGEWANDTE MATHEMATIK UND MECHANIK, Vol.95, Iss.3, 2015-03, pp. : 283-296
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
Effect of Improved Tracking for Atomic Force Microscope on Piezo Nonlinear Behavior
ASIAN JOURNAL OF CONTROL, Vol. 17, Iss. 3, 2015-05 ,pp. :
Nanoindentation using an atomic force microscope
Philosophical Magazine, Vol. 91, Iss. 7-9, 2011-03 ,pp. :
Dynamics of ferroelectric domain formation in an atomic force microscope
Philosophical Magazine, Vol. 85, Iss. 15, 2005-05 ,pp. :
The atomic force microscope as a near-field probe for ultrasound
By Rabe U. Dvorak M. Arnold W.
Thin Solid Films, Vol. 264, Iss. 2, 1995-08 ,pp. :