Publisher: John Wiley & Sons Inc
E-ISSN: 1551-2916|98|3|1034-1039
ISSN: 0002-7820
Source: JOURNAL OF THE AMERICAN CERAMIC SOCIETY, Vol.98, Iss.3, 2015-03, pp. : 1034-1039
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Investigation of Ni Doped Ge-Te Materials for High Temperature Phase Change Memory Applications
Materials Science Forum, Vol. 2016, Iss. 848, 2016-04 ,pp. :
MOS Interface Characteristics of In Situ Ge-Doped 4H-SiC Homoepitaxial Layers
Materials Science Forum, Vol. 2015, Iss. 821, 2015-07 ,pp. :