Temperature-dependent bias-stress-induced electrical instability of amorphous indium-gallium-zinc-oxide thin-film transistors

Author： Hui-Min Qian Guang Yu Hai Lu Chen-Fei Wu Lan-Feng Tang Dong Zhou Fang-Fang Ren Rong Zhang You-Liao Zheng Xiao-Ming Huang

Publisher： IOP Publishing

E-ISSN： 1741-4199|24|7|77307-77311

ISSN： 1674-1056

Source： Chinese Physics B, Vol.24, Iss.7, 2015-07, pp. : 77307-77311

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