![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Hao Wang Xing Chen Guang-Hui Xu Ka-Ma Huang
Publisher: IOP Publishing
E-ISSN: 1741-4199|24|7|77305-77310
ISSN: 1674-1056
Source: Chinese Physics B, Vol.24, Iss.7, 2015-07, pp. : 77305-77310
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
DISLOCATION ELECTRONIC STATES FROM SCHOTTKY DIODES IN SILICON
Le Journal de Physique Colloques, Vol. 40, Iss. C6, 1979-06 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Influence of thin inversion layers on Schottky diodes
Revue de Physique Appliquée (Paris), Vol. 21, Iss. 1, 1986-01 ,pp. :
![](/images/ico/o.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)