Modeling and analysis of the HPM pulse-width upset effect on CMOS inverter

Author: Xinhai Yu   Changchun Chai   Liping Qiao   Yintang Yang   Yang Liu   Xiaowen Xi  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.36, Iss.5, 2015-05, pp. : 54011-54016

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Abstract