The impact of process variations on input impedance and mitigation using a circuit technique in FinFET-based LNA

Author: Suresh D.   Nagarajan K. K.   Srinivasan R.  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.36, Iss.4, 2015-04, pp. : 45002-45007

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract