Fast Fourier transform scanning spreading resistance microscopy: a novel technique to overcome the limitations of classical conductive AFM techniques

Author： EybenP BisiauxP SchulzeA NazirA VandervorstW

Publisher： IOP Publishing

E-ISSN： 1361-6528|26|35|355702-355711

ISSN： 0957-4484

Source： Nanotechnology, Vol.26, Iss.35, 2015-09, pp. : 355702-355711

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