Higher accuracy and lower run time: efficient mutation analysis using non‐redundant mutation operators

Publisher: John Wiley & Sons Inc

E-ISSN: 1099-1689|25|5-7|490-507

ISSN: 0960-0833

Source: SOFTWARE TESTING, VERIFICATION & RELIABILITY (ELECTRONIC), Vol.25, Iss.5-7, 2015-08, pp. : 490-507

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Abstract