Publisher: John Wiley & Sons Inc
E-ISSN: 1610-1642|9|10‐11|2131-2133
ISSN: 1862-6351
Source: PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Vol.9, Iss.10‐11, 2012-10, pp. : 2131-2133
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Hot-wire silicon nitride for thin-film transistors
By Stannowski B. Rath J.K. Schropp R.E.I.
Thin Solid Films, Vol. 395, Iss. 1, 2001-09 ,pp. :
Silicon for thin-film transistors
By Wagner S. Gleskova H. Cheng I.-C. Wu M.
Thin Solid Films, Vol. 430, Iss. 1, 2003-04 ,pp. :
Refraction properties of PECVD of silicon nitride film
Vacuum, Vol. 72, Iss. 4, 2004-01 ,pp. :