Publisher: John Wiley & Sons Inc
E-ISSN: 1467-9590|97-1421|1|179-190
ISSN: 0022-2526
Source: STUDIES IN APPLIED MATHEMATICS, Vol.97-1421, Iss.1, 1950-04, pp. : 179-190
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
An Application of Auto‐Correlation Analysis
STUDIES IN APPLIED MATHEMATICS, Vol. 29, Iss. 1, 1950-04 ,pp. :
Application of Digital Image Correlation to Address Complex Motions in Thermoelastic Stress Analysis
STRAIN (ELECTRONIC), Vol. 39-2103, Iss. 5, 2015-10 ,pp. :
Process Yield Analysis for Linear Within‐Profile Autocorrelation
QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, Vol. 748-8017, Iss. 6, 2015-10 ,pp. :