Publisher： John Wiley & Sons Inc
E-ISSN： 1099-1638|31|6|1053-1061
ISSN： 0748-8017
Source： QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, Vol.31, Iss.6, 2015-10, pp. : 1053-1061
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Process Yield Analysis for Linear Within‐Profile Autocorrelation
QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, Vol. 748-8017, Iss. 6, 2015-10 ,pp. :
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