Publisher： John Wiley & Sons Inc
E-ISSN： 1600-5767|48|5|1587-1598
ISSN： 0021-8898
Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.5, 2015-10, pp. : 1587-1598
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
SASfit is one of the mature programs for small‐angle scattering data analysis and has been available for many years. This article describes the basic data processing and analysis workflow along with recent developments in the SASfit program package (version 0.94.6). They include (i) advanced algorithms for reduction of oversampled data sets, (ii) improved confidence assessment in the optimized model parameters and (iii) a flexible plug‐in system for custom user‐provided models. A scattering function of a mass fractal model of branched polymers in solution is provided as an example for implementing a plug‐in. The new SASfit release is available for major platforms such as Windows, Linux and MacOS. To facilitate usage, it includes comprehensive indexed documentation as well as a web‐based wiki for peer collaboration and online videos demonstrating basic usage. The use of SASfit is illustrated by interpretation of the small‐angle X‐ray scattering curves of monomodal gold nanoparticles (NIST reference material 8011) and bimodal silica nanoparticles (EU reference material ERM‐FD‐102).
Related content
Access to resources
Recommend
Small‐angle scattering of particle assemblies
JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 4, 2015-08 ,pp. :
Optimized pinhole geometry for small‐angle scattering
JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 6, 2015-12 ,pp. :