Empirical correction for resolution‐ and temperature‐dependent errors caused by factors such as thermal diffuse scattering

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|5|1485-1497

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.5, 2015-10, pp. : 1485-1497

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Modeling Thermal Pressurization Around Shallow Dikes Using Temperature‐Dependent Hydraulic Properties: Implications for Deformation Around Intrusions

By  

JOURNAL OF GEOPHYSICAL RESEARCH: SOLID EARTH, Vol. 123, Iss. 1, 2018-01 ,pp. : 311-323

John Wiley & Sons Inc

Access to resources Recommend Favorite

Correction to “Temperature dependent climate projection deficiencies in CMIP5 models”

By  

GEOPHYSICAL RESEARCH LETTERS, Vol. 40, Iss. 10, 2013-05 ,pp. : 2307-2308

John Wiley & Sons Inc

Access to resources Recommend Favorite

On the use of molecular dynamics simulation to calculate X‐ray thermal diffuse scattering from molecular crystals

By  

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 5, 2015-10 ,pp. : 1420-1428

John Wiley & Sons Inc

Access to resources Recommend Favorite

Temperature‐Dependent Immobilization of a Tungsten Peroxo Complex That Catalyzes the Hydroxymethoxylation of Olefins

By  

CHEMPLUSCHEM, Vol. 80, Iss. 6, 2015-06 ,pp. : 1029-1037

John Wiley & Sons Inc

Access to resources Recommend Favorite

Update to the Global Climate Data package: analysis of empirical bias correction methods in the context of producing very high resolution climate projections

By  

INTERNATIONAL JOURNAL OF CLIMATOLOGY, Vol. 38, Iss. 2, 2018-02 ,pp. : 825-840

John Wiley & Sons Inc

Access to resources Recommend Favorite