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Empirical correction for resolution‐ and temperature‐dependent errors caused by factors such as thermal diffuse scattering
Publisher: John Wiley & Sons Inc
E-ISSN: 1600-5767|48|5|1485-1497
ISSN: 0021-8898
Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.5, 2015-10, pp. : 1485-1497
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