Phase densities and lamellar morphologies of semicrystalline polyethylenes via absolute small‐angle X‐ray scattering measurements
Publisher： John Wiley & Sons Inc
E-ISSN： 1600-5767|48|5|1498-1506
ISSN： 0021-8898
Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.5, 2015-10, pp. : 1498-1506
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