Nanogap Electrodes: Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1–2 nm by Focused Ion Beam Milling (Adv. Mater. 19/2015)

Publisher： John Wiley & Sons Inc

E-ISSN： 1521-4095|27|19|3095-3095

ISSN： 0935-9648

Source： ADVANCED MATERIALS, Vol.27, Iss.19, 2015-05, pp. : 3095-3095

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