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John Wiley & Sons Inc

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Direct Probing of Nanodimensioned Oxide Multilayers with the Aid of Focused Ion Beam Milling

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John Wiley & Sons Inc

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Investigation of sub-surface damage during sliding wear of alumina using focused ion-beam milling

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Application of focused ion beam milling to cross-sectional TEM specimen preparation of industrial materials including heterointerfaces

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Residual stress measurement at the micrometer scale: focused ion beam (FIB) milling and nanoindentation testing

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