Synergy between transmission electron microscopy and powder diffraction: application to modulated structures

Publisher: John Wiley & Sons Inc

E-ISSN: 2052-5206|71|2|127-143

ISSN: 2052-5192

Source: ACTA CRYSTALLOGRAPHICA SECTION B (ELECTRONIC), Vol.71, Iss.2, 2015-04, pp. : 127-143

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Abstract