HERMES: a soft X‐ray beamline dedicated to X‐ray microscopy

Publisher: John Wiley & Sons Inc

E-ISSN: 1600-5775|22|4|968-979

ISSN: 0909-0495

Source: JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.4, 2015-07, pp. : 968-979

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Abstract