HERMES: a soft X‐ray beamline dedicated to X‐ray microscopy
Publisher: John Wiley & Sons Inc
E-ISSN: 1600-5775|22|4|968-979
ISSN: 0909-0495
Source: JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.4, 2015-07, pp. : 968-979
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Abstract