Crystallization dynamics and interface stability of strontium titanate thin films on silicon

Publisher: John Wiley & Sons Inc

E-ISSN: 1600-5767|48|2|393-400

ISSN: 0021-8898

Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.2, 2015-04, pp. : 393-400

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract