An accurate projection model for diffraction image formation and inversion using a polychromatic cone beam
Publisher: John Wiley & Sons Inc
E-ISSN: 1600-5767|48|2|334-343
ISSN: 0021-8898
Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.2, 2015-04, pp. : 334-343
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Abstract