Publisher: John Wiley & Sons Inc
E-ISSN: 1600-5767|48|2|464-476
ISSN: 0021-8898
Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.2, 2015-04, pp. : 464-476
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
XTOP: high‐resolution X‐ray diffraction and imaging
JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 3, 2015-06 ,pp. :
X‐ray imaging of Kelvin‐Helmholtz waves at the magnetopause
JOURNAL OF GEOPHYSICAL RESEARCH: SPACE PHYSICS, Vol. 120, Iss. 1, 2015-01 ,pp. :
X‐ray diffraction by phase diffraction gratings
JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 4, 2015-08 ,pp. :