Electron beam–specimen interactions and their effect on high‐angle annular dark‐field imaging of dopant atoms within a crystal

Publisher： John Wiley & Sons Inc

E-ISSN： 2053-2733|66|3|407-420

ISSN： 0108-7673

Source： ACTA CRYSTALLOGRAPHICA SECTION A (ELECTRONIC), Vol.66, Iss.3, 2010-05, pp. : 407-420

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