Grazing‐incidence small‐angle X‐ray scattering in a twofold rough‐interface medium: a new theoretical approach using the q‐eigenwave formalism

Publisher: John Wiley & Sons Inc

E-ISSN: 2053-2733|71|6|612-627

ISSN: 0108-7673

Source: ACTA CRYSTALLOGRAPHICA SECTION A (ELECTRONIC), Vol.71, Iss.6, 2015-11, pp. : 612-627

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Abstract