Measurement of surface resistivity/conductivity of different organic thin films by a combination of optical shearography and electrochemical impedance spectroscopy

Author： Habib Khaled  

Publisher： Springer Publishing Company

ISSN： 1340-6000

Source： Optical Review, Vol.20, Iss.6, 2013-11, pp. : 500-503

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Measurement of Macular Pigment Optical Density Using Two Different Heterochromatic Flicker Photometers

By Loane Edward   Stack Jim   Beatty Stephen   Nolan John M.  

Current Eye Research, Vol. 32, Iss. 6, 2007-06 ,pp. : 555-564

Informa Healthcare

Access to resources Recommend Favorite

Simultaneous measurement of surface shape and absolute optical thickness of a glass plate by wavelength tuning phase-shifting interferometry

By Hibino Kenichi   Kim Yangjin   Lee Sangyu   Kondo Yohan   Sugita Naohiko   Mitsuishi Mamoru  

Optical Review, Vol. 19, Iss. 4, 2012-07 ,pp. : 247-253

Springer Publishing Company

Access to resources Recommend Favorite

A superresolution optical disk with a combination of optical path filtering and saturable absorption techniques

By Wu Yihong   Chong Chong  

Optical Review, Vol. 4, Iss. 1, 1997-01 ,pp. : 195-198

Springer Publishing Company

Access to resources Recommend Favorite

Measurement and Modeling of Depth Cue Combination: in Defense of Weak Fusion

By Landy M.S.   Maloney L.T.   Johnston E.B.   Young M.  

Vision Research, Vol. 35, Iss. 3, 1995-02 ,pp. : 389-412

Elsevier

Access to resources Recommend Favorite

Real-time surface shape measurement by an active interferometer

By Liu Ji-Yuan   Yamaguchi Ichirou   Kato Jun-ichi   Nakajima Toshinori  

Optical Review, Vol. 4, Iss. 1, 1997-01 ,pp. : 216-220

Springer Publishing Company

Access to resources Recommend Favorite