Measurement of the thermal properties of thin dielectric films by a probe technique with periodic heating. I. Theory underlying the method

Author： Kravchun S. Davitadze S. Mizina N. Strukov B.

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7834

Source： Physics of the Solid State, Vol.39, Iss.4, 1997-04, pp. : 675-680

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