Measurement of the differential and integral distribution of diffuse x-ray scattering intensity from defects in thin strained layers

Author： Kyutt R.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7834

Source： Physics of the Solid State, Vol.39, Iss.7, 1997-07, pp. : 1052-1056

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