Application of X-ray diffuse scattering to structure determinations of point-defects

E-ISSN： 0035-1687|11|1|73-81

ISSN： 0035-1687

Source： Revue de Physique Appliquée (Paris), Vol.11, Iss.1, 1976-01, pp. : 73-81

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Apparatus for the study of point defects by X-ray scattering.

Journal de Physique, Vol. 24, Iss. 7, 1963-07 ,pp. : 560-564

Edp Sciences

Access to resources Recommend Favorite

X-ray diffuse scattering as a probe for thin film and interface structure

Journal de Physique III, Vol. 4, Iss. 9, 1994-09 ,pp. : 1543-1557

Edp Sciences

Access to resources Recommend Favorite

Measurement of the differential and integral distribution of diffuse x-ray scattering intensity from defects in thin strained layers

By Kyutt R.

Physics of the Solid State, Vol. 39, Iss. 7, 1997-07 ,pp. : 1052-1056

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

The theory of liquids and the prediction of diffuse X-ray scattering.

Journal de Physique et le Radium, Vol. 16, Iss. 5, 1955-05 ,pp. : 395-400

Edp Sciences

Access to resources Recommend Favorite

X-ray diffuse scattering and molecular dynamics in proteins

Le Journal de Physique IV, Vol. 04, Iss. C9, 1994-11 ,pp. : C9-293-C9-298

Edp Sciences

Access to resources Recommend Favorite