X-ray measurement of a microdistortion tensor and its application in an analysis of the dislocation structure of thick GaN layers obtained by hydrochloride gaseous-phase epitaxy

Author： Ratnikov V.   Kyutt R.   Shubina T.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7834

Source： Physics of the Solid State, Vol.42, Iss.12, 2000-12, pp. : 2204-2210

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