Erbium ion luminescence of silicon nanocrystal layers in a silicon dioxide matrix measured under strong optical excitation

Author: Timoshenko V.   Shalygina O.   Lisachenko M.   Zhigunov D.   Teterukov S.   Kashkarov P.   Kovalev D.   Zacharias M.   Imakita K.   Fujii M.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7834

Source: Physics of the Solid State, Vol.47, Iss.1, 2005-01, pp. : 121-124

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content