High resolution x-ray diffractometry of the structural characteristics of a semiconducting (InGa)As/GaAs superlattice

Author: Nesterets Ya.   Punegov V.   Pavlov K.   Faleev N.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7842

Source: Technical Physics, Vol.44, Iss.2, 1999-02, pp. : 171-179

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next