Line-Shape Analysis of High Resolution X-Ray Diffraction Spectra of Finite Size Thue-Morse GaAs-AlAs Multilayer Heterostructures

Publisher： Edp Sciences

E-ISSN： 1286-4862|5|1|111-127

ISSN： 1155-4304

Source： Journal de Physique I, Vol.5, Iss.1, 1995-01, pp. : 111-127

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