Using an atomic force microscope in the surface modification regime to determine the migration energy of surface defects

Author： Blagov E.   Mostepanchenko V.   Klimchitskaya G.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7842

Source： Technical Physics, Vol.44, Iss.8, 1999-08, pp. : 964-969

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