A noncontact method to study the charge state of the semiconductor-insulator interface

Author: Kryachko V.   Levin M.   Tatarintsev A.   Bormontov E.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7842

Source: Technical Physics, Vol.49, Iss.10, 2004-10, pp. : 1375-1380

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