Structural and noise characterization of VO2 films on SiO2/Si substrates

Author： Baidakova M.   Bobyl’ A.   Malyarov V.   Tret’yakov V.   Khrebtov I.   Shaganov I.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7850

Source： Technical Physics Letters, Vol.23, Iss.7, 1997-07, pp. : 520-522

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