Author: Veselovskii I. Grekhov I. Delimova L. Liniichuk I.
Publisher: MAIK Nauka/Interperiodica
ISSN: 1063-7850
Source: Technical Physics Letters, Vol.27, Iss.1, 2001-01, pp. : 17-19
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Modeling of a Metal-Ferroelectric-Semiconductor Field-Effect Transistor NAND Gate
By Phillips T.
Ferroelectrics, Vol. 333, Iss. 1, 2006-01 ,pp. :