X-ray topography contrast of edge dislocations perpendicular to the 6H-SiC crystal surface

Author: Okunev A.   Shul’pina I.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7850

Source: Technical Physics Letters, Vol.31, Iss.6, 2005-06, pp. : 491-493

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