Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology

Author： Tan Ye Kiekens Kim Welkenhuyzen Frank Angel J De Chiffre L Kruth Jean-Pierre Dewulf Wim

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.25, Iss.6, 2014-06, pp. : 64014-64023

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