A platform for in-situ multi-probe electronic measurements and modification of nanodevices inside a transmission electron microscope

Author： Xu T T Ning Z Y Shi T W Fu M Q Wang J Y Chen Q

Publisher： IOP Publishing

ISSN： 0957-4484

Source： Nanotechnology, Vol.25, Iss.22, 2014-06, pp. : 225702-225709

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