Effects of annealing process on characteristics of fully transparent zinc tin oxide thin-film transistor

Author: Yong-Yue Chen   Xiong Wang   Xi-Kun Cai   Zi-Jian Yuan   Xia-Ming Zhu   Dong-Jiang Qiu   Hui-Zhen Wu  

Publisher: IOP Publishing

ISSN: 1674-1056

Source: Chinese Physics B, Vol.23, Iss.2, 2014-02, pp. : 26101-26105

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