Author: Wei Wu Bo Zhang Jian Fang Xiaorong Luo Zhaoji Li
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.35, Iss.1, 2014-01, pp. : 14009-14013
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.