Measurement of the evanescent field using noncontact mode atomic force microscope

Author: Abe Masayuki   Uchihashi Takayuki   Ohta Masahiro   Ueyama Hitoshi   Sugawara Yasuhiro   Morita Seizo  

Publisher: Springer Publishing Company

ISSN: 1340-6000

Source: Optical Review, Vol.4, Iss.1, 1997-01, pp. : 232-235

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