Related content

Investigation of Near-Field Imaging Characteristics of Radial Polarization for Application to Optical Data Storage

By Kim Wan-Chin   Park No-Cheol   Yoon Yong-Joong   Choi Hyun   Park Young-Pil  

Optical Review, Vol. 14, Iss. 4, 2007-07 ,pp. : 236-242

Springer Publishing Company

Access to resources Recommend Favorite

Optical near field scattered by surface defects: Two-dimensional numerical analysis

By Wang Shu   Xiao Mufei  

Optical Review, Vol. 4, Iss. 1, 1997-01 ,pp. : 228-231

Springer Publishing Company

Access to resources Recommend Favorite

Improved near field lithography by surface plasmon resonance in groove-patterned masks

By Zeng Beibei   Pan Li   Liu Ling   Fang Liang   Wang Changtao   Luo Xiangang  

Journal of Optics A: Pure and Applied Optics, Vol. 11, Iss. 12, 2009-12 ,pp. : 125003-125007

IOP Publishing

Access to resources Recommend Favorite

Refractive-index dispersion measurement of bulk optical materials using a fiber raman laser widely tunable in the visible and near-infrared

By Ilev Ilko   Kumagai Hiroshi   Toyoda Koichi  

Optical Review, Vol. 4, Iss. 1, 1997-01 ,pp. : 61-64

Springer Publishing Company

Access to resources Recommend Favorite

Measurement of the evanescent field using noncontact mode atomic force microscope

By Abe Masayuki   Uchihashi Takayuki   Ohta Masahiro   Ueyama Hitoshi   Sugawara Yasuhiro   Morita Seizo  

Optical Review, Vol. 4, Iss. 1, 1997-01 ,pp. : 232-235

Springer Publishing Company

Access to resources Recommend Favorite