Effective Timing Error Tolerance in Flip-Flop Based Core Designs

Author： Valadimas Stefanos   Tsiatouhas Yiorgos   Arapoyanni Angela   Xarchakos Petros  

Publisher： Springer Publishing Company

ISSN： 0923-8174

Source： Journal of Electronic Testing, Vol.29, Iss.6, 2013-12, pp. : 795-804

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