Journal of Electronic Testing,volume 29,issue 6  (12-2013)

Period of time： 2013年6期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

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Journal of Electronic Testing,volume 29,issue 6

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Editorial

By Agrawal Vishwani in (2013)

Journal of Electronic Testing,volume 29,issue 6 , Vol. 29, Iss. 6, 2013-12 , pp. 741-742

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Test Technology Newsletter

By in (2013)

Journal of Electronic Testing,volume 29,issue 6 , Vol. 29, Iss. 6, 2013-12 , pp. 743-744

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Physics-Based Low-Cost Test Technique for High Voltage LDMOS

By Kannan Sukeshwar,Kannan Kaushal,Kim Bruce,Taenzler Friedrich,Antley Richard,Moushegian Ken,Butler Kenneth,Mirizzi Doug in (2013)

Journal of Electronic Testing,volume 29,issue 6 , Vol. 29, Iss. 6, 2013-12 , pp. 745-762

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Online Testable Approaches in Reversible Logic

By Nayeem N.,Rice J. in (2013)

Journal of Electronic Testing,volume 29,issue 6 , Vol. 29, Iss. 6, 2013-12 , pp. 763-778

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Autonomous Fault-Tolerant Systems onto SRAM-based FPGA Platforms

By Bolchini Cristiana,Miele Antonio,Sandionigi Chiara in (2013)

Journal of Electronic Testing,volume 29,issue 6 , Vol. 29, Iss. 6, 2013-12 , pp. 779-793

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Effective Timing Error Tolerance in Flip-Flop Based Core Designs

By Valadimas Stefanos,Tsiatouhas Yiorgos,Arapoyanni Angela,Xarchakos Petros in (2013)

Journal of Electronic Testing,volume 29,issue 6 , Vol. 29, Iss. 6, 2013-12 , pp. 795-804

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A Fault Tolerant Approach for FPGA Embedded Processors Based on Runtime Partial Reconfiguration

By Vavousis Alexandros,Apostolakis Andreas,Psarakis Mihalis in (2013)

Journal of Electronic Testing,volume 29,issue 6 , Vol. 29, Iss. 6, 2013-12 , pp. 805-823

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Selective SWIFT-R: A Flexible Software-Based Technique for Soft Error Mitigation in Low-Cost Embedded Systems

By Restrepo-Calle Felipe,Martínez-Álvarez Antonio,Cuenca-Asensi Sergio,Jimeno-Morenilla Antonio in (2013)

Journal of Electronic Testing,volume 29,issue 6 , Vol. 29, Iss. 6, 2013-12 , pp. 825-838

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MoDiVHA: A Hierarchical Strategy for Distributed Test Assignment

By Koppe Jefferson,Duarte Elias,Bona Luis in (2013)

Journal of Electronic Testing,volume 29,issue 6 , Vol. 29, Iss. 6, 2013-12 , pp. 839-847

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Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding

By Wu Tie-Bin,Liu Heng-Zhu,Liu Peng-Xia in (2013)

Journal of Electronic Testing,volume 29,issue 6 , Vol. 29, Iss. 6, 2013-12 , pp. 849-859

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