Multi-bit Sigma-Delta TDC Architecture with Improved Linearity

Author： Uemori Satoshi Ishii Masamichi Kobayashi Haruo Hirabayashi Daiki Arakawa Yuta Doi Yuta Kobayashi Osamu Matsuura Tatsuji Niitsu Kiichi Yano Yuji Gake Tatsuhiro Yamaguchi Takahiro Takai Nobukazu

Publisher： Springer Publishing Company

ISSN： 0923-8174

Source： Journal of Electronic Testing, Vol.29, Iss.6, 2013-12, pp. : 879-892

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