Predicting X‐ray diffuse scattering from translation–libration–screw structural ensembles

Publisher: John Wiley & Sons Inc

E-ISSN: 1399-0047|71|8|1657-1667

ISSN: 0907-4449

Source: ACTA CRYSTALLOGRAPHICA SECTION D (ELECTRONIC), Vol.71, Iss.8, 2015-08, pp. : 1657-1667

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Abstract